옵틱 클라우드의 Detector - Photodetector Chip 제품들 입니다.

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InGaAs Avalanche Photodiode (APD) chips are semiconductor devices that are designed to detect weak optical signals in the infrared region. They are used in a variety of applications, such as fiber optic communications, LIDAR, and sensing. An APD is a type of photodiode that incorporates an internal gain mechanism, which allows it to achieve higher sensitivity than a standard photodiode. The gain is achieved through a process called avalanche multiplication, where a single photon creates an electron-hole pair, which then undergoes impact ionization, producing additional electron-hole pairs. This process results in an amplified output signal. InGaAs APDs are particularly useful for detecting wavelengths between 800 and 1700 nm.LD-PD INC is a company who design and manufacture InGaAs APD Chips.
Product model
LP-APD200Response wavelength: 900-1700nm
Material: InGaAs
Parameter
Electro-Optical Characteristics (@ Tc=22±3℃)
Parameter
Symbol
Test Condition
Min.
Typ.
Max.
Unit
Response Spectrum
λ
—
950 ~ 1700
nm
Responsivity
Re
λ=1550nm
Pin=1μW, M=1
0.90
1.00
—
A/W
Multiplication factor
M
λ=1550nm
Pin=1μW, VR=VBR-3
10.00
—
—
λ=1550nm
Pin=1μW, VR=VBR-1
30.00
—
—
—
Dark Current
Id
VR=VBR-3, Pin=0μW
—
8.00
50.00
nA
-3dB Cut-off frequency
BW
M=10
RL=50Ω
0.60
1.25
—
GHz
Reverse Breakdown Voltage
VBR
IR =10μA, Pin=0μW
35.00
50.00
V
Capacitance
C
VR=VBR-3, f=1MHz
—
1.80
2.00
pF
Temperature Coefficient of VBR
γ
IR=10μA, Pin=0μW
-55℃~+85℃
0.07
0.11
0.15
V/℃
Absolute Maximum Rating
Parameter
Symbol
Min.
Max.
Unit
APD Voltage supply
VPD
—
VBR
V
Operating Temperature
TC
-40
+85
⁰C
Storage Temperature
TSTG
-55
+125
⁰C
Forward Current
IF
—
5
mA
Reverse Current
IR
—
3
mA
Typical Performance Curves (@ Tc=22±3℃)
Parameter
Min.
Typ.
Max.
Unit
Notes
Die Width
375
385
395
µm
Die Length
375
385
395
µm
Thickness
115
125
135
µm
Detection Window
—
200
—
µm
Bonding Pad Diameter
—
80
—
µm
Au metal
● Distance measurement
● Spatial light transmission
● OTDR
● Low-light-level detection